Coating
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Spectroscopy, Liquid crystal, surface analysis, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...
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Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Spintronics / magneto-electronics, Coating, Magnetic properties, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Microscopy, Scanning Electron Microscopy, Professional Scientific and Technical Services, ...
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HEX Series The HEX platform offers an unmatched level of user control and customization, designed to incorporate the latest thin film technologies and performance into a bench top PVD system. Applications: Nanoscience, Electronics, Semiconductors, ... Features: HV, Customizable chamber, ... Techniques: Physical Vapor Deposition, Sputtering, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Electronics, Intermetallics, Photon experiments, ... Features: Customizable chamber, Imaging, ... Techniques: Sensor Tester, ...
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J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: surface analysis, Coating, Nanoscience, ... Features: Imaging, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ...
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CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Thin films, Nanoscience, Coating, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ...
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icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Material inspection, Nano-Indentation, Thin films, ... Features: Compact and easy-to-use, Automation, ... Techniques: Atomic Force Microscopy, ...
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Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Electrical Characterization, Photon experiments, Electronics, ... Features: Customizable chamber, Compact / Portable, ... Techniques: Sensor Tester, ...
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J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Quality control of the product, Liquid crystal, Thin films, ... Features: Low temperature, Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ...
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icspi Redux AFM Motorized AFM on your benchtop. Get the data you need even faster with Redux. Applications: Nano-Indentation, Nanoscience, Thin films, ... Features: Automation, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Intermetallics, Photon experiments, Coating, ... Features: Non Destructive, Imaging, ... Techniques: Solar Simulator, ...