Biotechnology & Chemistry
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FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Quality control of the product, Healthcare, Microscopy, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Scanning Electron Microscopy, Microscopy, ...
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Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Semiconductors, Electron Backscatter Diffraction, Electrical Characterization, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Microscopy, Electron beam, Atomic Force Microscopy, ...
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GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Electron Backscatter Diffraction, Electrical Characterization, Chemical mapping, ... Features: Vibration Stability, Imaging, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Microscopy, Scanning Electron Microscopy, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Electronics, Intermetallics, Photon experiments, ... Features: Non Destructive, Customizable chamber, ... Techniques: Sensor Tester, ...
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icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Thin films, Semiconductors, surface analysis, ... Features: Imaging, Compact and easy-to-use, ... Techniques: Atomic Force Microscopy, ...
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Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Electrical Characterization, Finding new material, Material inspection, ... Features: Non Destructive, Customizable chamber, ... Techniques: Sensor Tester, ...
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icspi Redux AFM Motorized AFM on your benchtop. Get the data you need even faster with Redux. Applications: Material inspection, Coating, Nanoscience, ... Features: Automation, Compact and easy-to-use, ... Techniques: Microscopy, Atomic Force Microscopy, ...
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Scienta Omicron Scienta Omicron ARPES Systems Applications: Chemical mapping, Microscopy, ... Features: Automation, Vacuum, ... Techniques: , X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron HiPP-Lab Applications: Chemical mapping, Microscopy, ... Features: Automation, Temperature Control, ... Techniques: , , X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron MBE Systems Universal Compact Laboratory MBE Systems Applications: ... Features: Temperature Control, Automation, ... Techniques: , X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron NanoSAM Lab Chemical Analysis with Ultimate Resolution Applications: Microscopy, Chemical mapping, ... Features: , Temperature Control, ... Techniques: X-ray Photoelectron Spectroscopy (XPS), X-ray Photoelectron Spectroscopy (XPS), ...
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Scienta Omicron Scienta Omicron XPS Systems Applications: Chemical mapping, Microscopy, ... Features: Vacuum, Temperature Control, ... Techniques: , , X-ray Photoelectron Spectroscopy (XPS), ...
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Magritek Spinsolve 60 Applications: Fluorescence/Phosphorescence lifetime imaging, Spectroscopy, Quality control of the product, ... Features: Remote Access, No External Cooling Requirements, ... Techniques: Nuclear magnetic resonance (NMR), ...
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Magritek Spinsolve 80 high performance benchtop NMR spectrometers Applications: Fluorescence/Phosphorescence lifetime imaging, Quality control of the product, Nuclear magnetic resonance (NMR), ... Features: Remote Access, Thermal Stability, ... Techniques: Nuclear magnetic resonance (NMR), ...
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Magritek Spinsolve 90 Applications: Nuclear magnetic resonance (NMR), Spectroscopy, Quality control of the product, ... Features: Fast Spectral Detection, Temperature Control, ... Techniques: Nuclear magnetic resonance (NMR), ...
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Magritek Spinsolve Ultra Measure sub-millimolar components dissolved in neat protonated solvents in 8 minutes Applications: Quality control of the product, Fluorescence/Phosphorescence lifetime imaging, Nuclear magnetic resonance (NMR), ... Features: No External Cooling Requirements, Remote Access, ... Techniques: Nuclear magnetic resonance (NMR), ...
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Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Finding new material, Material inspection, Spectroscopy, ... Features: Customizable chamber, Non Destructive, ... Techniques: Solar Simulator, ...
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Janis VPF Series Cryostat Systems - Sample in Vacuum Applications: Semiconductors, Nanoscience, Electrical Characterization, ... Features: Low temperature, Vacuum, ... Techniques: Electrical transport, Optical spectroscopy, Microscopy, ...
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Zahner-Elektrik Zennium X The ZENNIUM X is a modular potentiostat / galvanostat including a frequency response analyzer (FRA). The ZENNIUM X potentiostat offers 32 bit DC resolution and 24 bit AC resolution across 12 different current ranges, which enables it to carry out outstandingly precise and accurate measurements. Nine extension slots allow versatile customization of the potentiostat for use in different fields of electrochemistry. Applications: Electronics, Quality control of the product, Finding new material, ... Features: Compact / Portable, No External Cooling Requirements, ... Techniques: ...