Nano-Observer AFM

Capabilities

High Resolution AFM
The Nano-Observer AFM microscope uses an advanced flat scanning stage to avoid well known defects of the piezoelectric tube scanner such as bow, X-Y crosstalk etc. A low noise feedback control delivers reliable and high performance. A patented flexure stage with 3 independent low voltage piezoelectric devices mounted in a massive platform and combined with a low noise laser and electronics achieves high resolution measurement at atomic scale.

Quality Measurements
Through a smart choice of analog and digital processing, each signal is enhanced to avoid addition of noise and perform a fast feedback. The scanner is controlled by 24-bit D/A converters providing high precision scan to the AFM. A built-in lock-in for accurate topography, phase or MFM/EFM/KFM and PFM measurements is coupled with low noise electronics to acquire highly resolved images and spectroscopy



Top & side view for tip/sample positioning
A video color camera is provided with the AFM microscope offering an helpful viewing from the top for tip/sample positioning or side view to make the tip/sample approach easier.

• Sample/tip visibility
• Ease of use
• Avoids damaging sample or tip
• Better contrast by lateral illumination

High performance optic (option)
A high performance optic (option) is also available to localize small features on your sample.



Intuitive software
Only main parameters are displayed for a clean and simple interface software.

• AFM Mode choice in one click
• Autoset of the controller ! (no cables or module to mount or remove)
• Pre-configured software (auto settings of most of the parameters)
• Atomic Force Microscope adjustment by “Steps” : the user can follow defined “steps” to set easily the AFM.

AFM Modes

Multiple AFM Modes

In addition to performance, the Nano-Observer is capable of several advanced modes which expand your field of investigation. Beside contact/LFM and Oscillating/ Phase imaging, several modes are available to characterize mechanical viscoelasticity, adhesion of your samples as well as electrical properties (CAFM, ResiScopeTM), electric and magnetic fields (MFM/ EFM) and surface potential (standard KFM or HD-KFMTM) . 8 real-time image channels are available to increase capability of analysis.



Electric Field Microscopy (EFM)
Electric Field Microscopy is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface



Magnetic Field Microscopy (MFM)
Magnetic Field Microscopy is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

Conductive AFM (C-AFM)
Conductive AFM is an AFM contact mode. A conductive tip saves the current variations of the surface using an amplifier. Curves of current / voltage can be conducted at various locations on the sample.

Force Modulation Microscopy (FMM)
Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip during the scan. A map of mechanical properties is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.


Piezo Force Microscopy (PFM)
Piezo Force Microscopy is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

More AFM modes
All AFM modes (https://www.csinstruments.eu/afm-modes/)
See gallery (https://www.csinstruments.eu/gallery/)

Advanced modes

HD-KFM^TM (Kelvin Force Microscopy)
CSInstruments has developed an ultra-sensitive implementation of KFM named as High Definition-KFM (HD-KFM), which uses 2 lock-ins matched to the first two eigenmode frequencies of the cantilever to acquire both topography and SP.
More Info (https://www.csinstruments.eu/hd-kfm-mode/)

ResiScope^TM II (Resistance over 10 decades)
The Nano-Observer AFM has a unique ResiScope mode based on a specialized electronics to measure resistivity over 10 orders of magnitude, compared to the typical 3-4 orders of magnitude obtained with standard conductive setups in other AFMs.
More Info (https://www.csinstruments.eu/electrical-measurements/resiscope/)

Soft ResiScope
For delicate samples like polymers or organic materials, CSI has developed the Soft ResiScope mode, which allows to perform the resistance measurements in an intermittent contact mode with constant force. This allows to avoid or minimize wear/friction on the tip/sample
More Info (https://www.csinstruments.eu/afm-soft-resiscope/)

Environments

The Nano-Observer AFM Microscope also combines different environments such as temperature, liquid measurements or environment control.

Environmental control
Improve your AFM electrical measurements & protect your sample (gas, humidity…).
More Info (https://www.csinstruments.eu/afm-environmental-control/)

EZ Liquids
The Nano-Observer AFM is compatible with imaging in liquid environment… More Info (https://www.csinstruments.eu/afm-liquid-measurements/)

EZ TEMPerature
-40°C to 300°C, compatible with oscillating and contact modes …
More Info (https://www.csinstruments.eu/afm-temperature/)

Videos