Spectroscopic ellipsometry
-
J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Nanoscience, Optical crystals, Quality control of the product, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ...
-
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Nanoscience, surface analysis, Spectroscopy, ... Features: Low temperature, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ...
-
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Nanoscience, Optical crystals, Liquid crystal, ... Features: Imaging, Fast Spectral Detection, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...